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Year
Title
Author(s)
Citation
2003 Studies on sensitivity and etching resistance of calix[4]arene derivatives as negative tone electron beam resists A. Ruderisch, H. Sailer, V. Schurig, D.P. Kern Microelec. Eng. 67-68, 292-299 (2003)
2003 Detection of antibody peptide interaction using microcantilevers as surface stress sensors B.H. Kim, O. Mader, U. Weimar, R. Brock, D.P. Kern J. Vac. Sci. Technol. B 21(4), 1472-1475 (2003)
2002 Fabrication of micromechanical mass-sensitive resonators with increased mass resolution using SOI substrate B.H. Kim, D.P. Kern, S. Raible, U. Weimar Microelec. Eng. 61-62, 947-953 (2002)
2002 Evaluation of calixarene - derivatives as high-resolution negative tone electron-beam resists H. Sailer, A. Ruderisch, D.P. Kern and V. Schurig J. Vac. Sci. Technol. B20(6), 2958-2961 (2002)
2001 Mark detection in low-energy electron-beam lithography G.S. Fritz and D.P. Kern J. Vac. Sci. Technol. B19(6), 2512-2515 (2001)
2001 Vertical p-type high-mobility heterojunction metal-oAxide-semiconductor field-effect transistors X. Chen, Q. Ouyang, S.K. Jayanarayanan, F.E. Prins, S. Banerjee Appl. Phys. Lett. 78, 3334 (2001)
2001 An asymmetric Si/Si1-xGex channel vertical p-type metal-oxide-semiconductor field-effect transistor X. Chen, Q. Ouyang, S.K. Jayanarayanan, F.E. Prins, S. Banerjee Solid-State Electronics 45, 281 (2001)
2001 Simultanous operation of two adjacent double dots in silicon C. Single, F.E. Prins, D.P. Kern Appl. Phys. Lett. 78, 1421 (2001)
2001 How to improve lateral pn-junction electron detectors for microcolumn systems G.S. Fritz, F.E. Prins, D.P. Kern Microelectron. Eng. 57-58, 199 (2001)
2001 Coulomb blockade structures in poly-crystalline silicon W. Neu, R. Augke, F.E. Prins, D.P. Kern Microelectron. Eng. 57-58, 989 (2001)
2001 Influence of background charges on Coulomb blockade in quantum dots M. Skender, R. Straub, F.E. Prins, D.P. Kern Microelectron. Eng. 57-58, 1023 (2001)
2001 Multicomponent analysis and prediction with a cantilever array based sensor B.H. Kim, F.E. Prins, D.P. Kern, S. Raible, U. Weimar Sensors and Actuators B 78, 12 (2001)
2000 Towards Quantum-Cellular-Automata Operation in Silicon: Transport Properties of Silicon Multiple Dot Structures C. Single, R. Augke, F.E. Prins, D.A. Wharam, D.P. Kern SupeArlattices and Microstructures 28, 429 (2000)
2000 Scanning Tunneling Microscopy on Self-Assembled Calix[4]resorcinarene Monolayer Adsorbates on Au(111) S. Raible, J. Peiffer, T. Weiß, W. Clauss, W. Göpel, V. Schurig, D.P. Kern Applied Physics A70, 607-611 (2000)
2000 Parallel Frequency Readout of an Array of Mass-Sensitive Transducers for Sensor Applications, B.H. Kim, M. Maute, F.E. Prins, D.P. Kern, M. Croitoru, S. Raible, U. Weimar, W. Göpel, Microelec. Eng. 53, 229-232 (2000)
2000 Self-limiting and pattern dependent oxidation of silicon dots fabricated on silicon-on-insulator material H. Heidemeyer, C. Single, F. Zhou, F.E. Prins, D.P. Kern and E. Plies J. Appl. Phys. 87 (2000) 4580
2000 Doped silicon single electron transistors with single island characteristics R. Augke, W. Eberhardt, C. Single, F.E. Prins, D.A. Wharam, D.P. Kern Appl. Phys. Letts. 76 (2000) 2065
2000 Independent magnetotransport in parallel InGaAs double quantum wells with strongly different properties H.S. Fresser, H. Frey, F.E. Prins, D.A. Wharam, D.P. Kern, J. Böttcher and H. Künzel Semicond. Sci. Technol. 15 (2000) 242
2000 Single-electron charging in doped silicon double dots C. Single, R. Augke, F.E. Prins, D.A. Wharam and D.P. Kern Semicond. Sci. Technol. 14 (1999) 1165
2000 Local electronic properties of single-wall nanotube circuits measured by conducting-tip AFM .... .... W. Clauss Phys. Rev. B - Rapid Communications, 62 (2000) R2307
2000 Scanning Tunneling Microscopy on self-assembled caix[4]resorcinarene monolayer adsorbates on Au(111) S. Raible, J. Pfeiffer, T. Weiss, W. Clauss, W. Goepel, V. Schuring, and D. P. Kern Appl. Phys. A 70 (2000) 607
2000 Characterization and Manipulation of Carbon Nanotubes by Scanning Force and Scanning Tunnelling Microscopy W. Clauss Adv. Sol. State Phys. 40, (2000)
1999 Lateral pn-Junctions as a novel electron detector for microcolumn systems G.S. Fritz, H.S. Fresser, F.E. Prins, and D.P. Kern J. Vac. Sci. Technol. B 17, 2836 (1999)
1999 Detection of volatile organic compounds (VOCs) with polymer-coated cantilevers M. Maute, S. Raible, F.E. Prins, D.P. Kern, H. Ulmer, U. Weimar, W. Göpel Sensors and Actuators B58 (1999) 505-511
1999 Detection of Volatile Compounds (VOCs) with Polymer Coated Cantilevers:Changes in Resonances of Thermal Noise W. Göpel, M. Maute, S. Raible, F.E. Prins, D.P. Kern, H. Ulmer, U. Weimar Tranducers'99,
"The 10th International Conference on Solid-State Sensors and Actuators",
Volume 1, Pages 636-639
1999 Landau-level interplay in InGaAs double quantum wells H.S. Fresser, F.E. Prins, D.A. Wharam, D.P. Kern, J. Böttcher, H. Künzel Superlattices and Microstructures 25 (1999) 175
1999 Fabrication and Characterization of Coulomb Blockade Devices in Silicon R. Augke, W. Eberhardt, S. Strähle, F.E. Prins, D.P. Kern Microelectronic Engineering 46 (1999) 141
1999 Fabrication and Application of Polymer Coated Cantilevers as Gas Sensors M. Maute, S. Raible, F.E. Prins, U. Weimar, D.P. Kern, W. Göpel Microelectronic Engineering 46 (1999) 439
1999 Thermal Oxidation of Silicon-on-Insulator Dots F.E. Prins, C. Single, F. Zhou, H. Heidemeyer, D.P. Kern, E. Plies Nanotechnology 10 (1999) 132
1999 Backscattering of Electronic States on Single Wall Carbon Nanotubes observed by Scanning Tunneling Microscopy W. Clauss, J. Zhang, D. J. Bergeron, and A. T. Johnson Europhys. Lett. 47 601 (1999)
1999 Application and calibration of a quartz needle sensor for high resolution scanning force microscopy W. Clauss J. Vac. Sci. Technol. B 17, 1309 (1999)
1999 Scanning Tunneling Microscopy on Carbon Nanotubes W. Clauss Applied Physics A 69, 275 (1999)
1999 Elektronische Eigenschaften von Kohlenstoff-Nanoröhren – gesehen A mit dem Rastersondenmikroskop W. Clauss Physikalische Blätter 55 (Heft 5), 45, (1999)
     		  

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